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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Test and repair of large embedded DRAMs. I
McConnell, R., Rajsuman, R.Year:
2001
Language:
english
DOI:
10.1109/TEST.2001.966630
File:
PDF, 938 KB
english, 2001