[IEEE Comput. Soc. Press IEEE Conference on Computer Vision...

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[IEEE Comput. Soc. Press IEEE Conference on Computer Vision and Pattern Recognition - New York, NY, USA (15-17 June 1993)] Proceedings of IEEE Conference on Computer Vision and Pattern Recognition - On the recognition of occluded shapes and generic faces using multiple-template expansion matching

Ben-Arie, J., Rao, K.R.
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Year:
1993
Language:
english
DOI:
10.1109/cvpr.1993.340987
File:
PDF, 511 KB
english, 1993
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