A comparative study of heavy-ion and proton-induced...

IEEE Transactions on Nuclear Science 2004 / 12 Vol. 51; Iss. 6

A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

Marshall, P., Carts, M., Campbell, A., Ladbury, R., Reed, R., Marshall, C., Currie, S., McMorrow, D., Buchner, S., Seidleck, C., Riggs, P., Fritz, K., Randall, B., Gilbert, B.
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Volume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2004.839193
Date:
December, 2004
File:
PDF, 245 KB
english, 2004
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