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[IEEE 2006 IEEE International Conference on Vehicular Electronics and Safety - Shanghai, China (2006.12.13-2006.12.15)] 2006 IEEE International Conference on Vehicular Electronics and Safety - Reliability Analysis of CAN nodes under Electromagnetic Interference
Juexiao, Chen, Feng, Luo, Zechang, SunYear:
2006
Language:
english
DOI:
10.1109/icves.2006.371617
File:
PDF, 1.76 MB
english, 2006