[IEEE 2008 Annual Reliability and Maintainability Symposium - Las Vegas, NV, USA (2008.01.28-2008.01.31)] 2008 Annual Reliability and Maintainability Symposium - Consideration of Burn-In acceleration and effective screening procedure in latest System LSI
Nobuyuki Wakai,, Yuji Kobira,, Hidemitsu Egawa,Year:
2008
Language:
english
DOI:
10.1109/rams.2008.4925805
File:
PDF, 832 KB
english, 2008