[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Hierarchical test generation using precomputed testsd for modules
Murray, B.T., Hayes, J.P.Year:
1988
Language:
english
DOI:
10.1109/test.1988.207806
File:
PDF, 819 KB
english, 1988