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[IEEE 2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Penang, Malaysia (2008.11.4-2008.11.6)] 2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Six sigma methodology in improving assembly yield of high-power and high-brightness ligth-emitting diodes packages for automotive application
Law, R.C, Li Zhang,, Beh, H.Y., Kmetec, J., Wall, Frank, Chan, C.E, Koay, H.KYear:
2008
Language:
english
DOI:
10.1109/iemt.2008.5507829
File:
PDF, 2.67 MB
english, 2008