Single-event effects ground testing and on-orbit rate...

IEEE Transactions on Nuclear Science 2003 / 06 Vol. 50; Iss. 3

Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

Reed, R.A., Kinnison, J., Pickel, J.C., Buchner, S., Marshall, P.W., Kniffin, S., LaBel, K.A.
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Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2003.813331
Date:
June, 2003
File:
PDF, 338 KB
english, 2003
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