[IEEE 2011 IEEE International Test Conference (ITC) -...

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[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores

Sharma, Manish, Dutta, Avijit, Cheng, Wu-Tung, Benware, Brady, Kassab, Mark
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Year:
2011
Language:
english
DOI:
10.1109/test.2011.6139171
File:
PDF, 840 KB
english, 2011
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