Two-axis probing system for atomic force microscopy

Review of Scientific Instruments 2008 Vol. 79; Iss. 2

Two-axis probing system for atomic force microscopy

Jayanth, G. R., Jhiang, Sissy M., Menq, Chia-Hsiang
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Volume:
79
Year:
2008
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2841805
File:
PDF, 681 KB
english, 2008
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