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[IEEE 2008 IEEE International Conference on Robotics and Automation (ICRA) - Pasadena, CA, USA (2008.05.19-2008.05.23)] 2008 IEEE International Conference on Robotics and Automation - Detection and real-time correction of faulty visual feedback in atomic force microscopy based nanorobotic manipulation
Lianqing Liu,, Ning Xi,, Yilun Luo,, Yuechao Wang,, Jiangbo Zhang,, Guangyong Li,Year:
2008
Language:
english
DOI:
10.1109/robot.2008.4543245
File:
PDF, 1.69 MB
english, 2008