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[IEEE 2012 IEEE 58th Holm Conference on Electrical Contacts (Holm 2012) - Portland, OR, USA (2012.09.23-2012.09.26)] 2012 IEEE 58th Holm Conference on Electrical Contacts (Holm) - Quantitative Evolution of Electrical Contact Resistance between Aluminum Thin Films
Mercier, David, Mandrillon, Vincent, Holtz, Anthony, Volpi, Fabien, Verdier, Marc, Bréchet, YvesYear:
2012
Language:
english
DOI:
10.1109/holm.2012.6336550
File:
PDF, 689 KB
english, 2012