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[IEEE 2007 IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (2007.05.27-2007.05.30)] 2007 IEEE International Symposium on Circuits and Systems - GALS Based Shared Test Architecture for Embedded Memories
Dubey, Prashant, Garg, Akhil, Bhaskarani, Sravan KumarYear:
2007
Language:
english
DOI:
10.1109/iscas.2007.378245
File:
PDF, 298 KB
english, 2007