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[IEEE Comput. Soc 2005 International Conference on Computer Design - San Jose, CA, USA (2-5 Oct. 2005)] 2005 International Conference on Computer Design - A soft error monitor using switching current detection
Ndai, P., Agarwal, A., Qikai Chen,, Roy, K.Year:
2005
Language:
english
DOI:
10.1109/iccd.2005.15
File:
PDF, 230 KB
english, 2005