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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Min-log approach to modeling dielectric breakdown data
Yashchin, Emmanuel, Baozhen Li,, Stathis, James, Wu, ErnestYear:
2012
Language:
english
DOI:
10.1109/irps.2012.6241911
File:
PDF, 378 KB
english, 2012