[IEEE ESSDERC 2010 - 40th European Solid State Device Research Conference - Sevilla, Spain (2010.09.14-2010.09.16)] 2010 Proceedings of the European Solid State Device Research Conference - Tri-gate bulk CMOS technology for improved SRAM scalability
Shin, Changhwan, Nikolic, Borivoje, King Liu, Tsu-Jae, Tsai, Chen Hua, Wu, Mei Hsuan, Chang, Chung Fu, Liu, You Ren, Kao, Chih Yang, Lin, Guan Shyan, Chiu, Kai Ling, Fu, Chuan-Shian, Tsai, Cheng-tzungYear:
2010
Language:
english
DOI:
10.1109/essderc.2010.5618437
File:
PDF, 729 KB
english, 2010