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Bypassing the Combinatorial Explosion: Using Similarity to Generate and Prioritize T-Wise Test Configurations for Software Product Lines
Henard, Christopher, Papadakis, Mike, Perrouin, Gilles, Klein, Jacques, Heymans, Patrick, Le Traon, YvesVolume:
40
Language:
english
Journal:
IEEE Transactions on Software Engineering
DOI:
10.1109/tse.2014.2327020
Date:
July, 2014
File:
PDF, 1.22 MB
english, 2014