[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices
Rai, Nivesh, Hashempour, Hamidreza, Xing, Yizi, Kruseman, Bram, Hamdioui, SaidYear:
2011
Language:
english
DOI:
10.1109/dft.2011.21
File:
PDF, 609 KB
english, 2011