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[IEEE Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's - Atlantic City, NJ, USA (15-17 April 1991)] Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's - An analysis of feedback bridging faults in MOS VLSI
Rajsuman, R.Year:
1991
DOI:
10.1109/vtest.1991.208132
File:
PDF, 336 KB
1991