![](/img/cover-not-exists.png)
Influence of Large-Aspect-Ratio Surface Roughness on Electrical Characteristics of AlGaN/AlN/GaN HFETs
Fagerlind, M., Booker, I., Bergman, P., Janzen, E., Zirath, H., Rorsman, N.Volume:
12
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2012.2188403
Date:
September, 2012
File:
PDF, 1.01 MB
english, 2012