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[IEEE 2009 Spanish Conference on Electron Devices (CDE) - Santiago de Compostela, Spain (2009.02.11-2009.02.13)] 2009 Spanish Conference on Electron Devices - Analysis of RF noise performance of Si/SiGe pseudomorphic MOSFETs
Calvo-Gallego, Jaime, Fobelets, Kristel, Perez, J.E. VelazquezYear:
2009
Language:
english
DOI:
10.1109/sced.2009.4800538
File:
PDF, 3.40 MB
english, 2009