[IEEE 2009 Spanish Conference on Electron Devices (CDE) -...

  • Main
  • [IEEE 2009 Spanish Conference on...

[IEEE 2009 Spanish Conference on Electron Devices (CDE) - Santiago de Compostela, Spain (2009.02.11-2009.02.13)] 2009 Spanish Conference on Electron Devices - Analysis of RF noise performance of Si/SiGe pseudomorphic MOSFETs

Calvo-Gallego, Jaime, Fobelets, Kristel, Perez, J.E. Velazquez
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/sced.2009.4800538
File:
PDF, 3.40 MB
english, 2009
Conversion to is in progress
Conversion to is failed