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[IEEE IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA (November 6-10, 1994)] IEEE/ACM International Conference on Computer-Aided Design - Measurement And Modeling Of MOS Transistor Current Mismatch In Analog IC's
Felt, E., Narayan, A., Sangiovanni-Vlncentelli, A.Year:
1984
Language:
english
DOI:
10.1109/iccad.1994.629779
File:
PDF, 657 KB
english, 1984