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[IEEE 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (21-25 July 1997)] Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits - New layout design for submicron CMOS output transistors to improve driving capability and ESD robustness in per unit layout area
Ming-Dou Ker,, Tung-Yang Chen,, Chung-Yu Wu,Year:
1997
Language:
english
DOI:
10.1109/ipfa.1997.638152
File:
PDF, 968 KB
english, 1997