[IEEE 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops) - San Francisco, CA, USA (2010.06.13-2010.06.18)] 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Workshops - Occlusion detection for ICAO compliant facial photographs
Storer, Markus, Urschler, Martin, Bischof, HorstYear:
2010
Language:
english
DOI:
10.1109/cvprw.2010.5544616
File:
PDF, 5.37 MB
english, 2010