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[IEEE Computer Soc 18th International Conference on VLSI Design - Kolkata, India (3-7 Jan. 2005)] 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design - A low overhead high speed histogram based test methodology for analog circuits and IP cores
Bahukudumbi, S., Bharath, K.Year:
2005
Language:
english
DOI:
10.1109/icvd.2005.16
File:
PDF, 163 KB
english, 2005