[IEEE 2012 International Symposium on Optomechatronic Technologies (ISOT 2012) - Paris, France (2012.10.29-2012.10.31)] 2012 International Symposium on Optomechatronic Technologies (ISOT 2012) - Twin-scale vernier micro-pattern for visual measurement of 1D in-plane absolute displacements with increased range-to-resolution ratio
Zea, July Galeano, Sandoz, Patrick, Laurent, Guillaume, Lemos, Lucas Lopes, Clevy, CedricYear:
2012
Language:
english
DOI:
10.1109/isot.2012.6403278
File:
PDF, 3.20 MB
english, 2012