[IEEE 2012 International Symposium on Optomechatronic...

  • Main
  • [IEEE 2012 International Symposium on...

[IEEE 2012 International Symposium on Optomechatronic Technologies (ISOT 2012) - Paris, France (2012.10.29-2012.10.31)] 2012 International Symposium on Optomechatronic Technologies (ISOT 2012) - Twin-scale vernier micro-pattern for visual measurement of 1D in-plane absolute displacements with increased range-to-resolution ratio

Zea, July Galeano, Sandoz, Patrick, Laurent, Guillaume, Lemos, Lucas Lopes, Clevy, Cedric
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2012
Language:
english
DOI:
10.1109/isot.2012.6403278
File:
PDF, 3.20 MB
english, 2012
Conversion to is in progress
Conversion to is failed