Angular Dependence of the Ion-Induced Secondary Electron...

Microscopy and Microanalysis 2011 / 7 Vol. 17; Iss. 4

Angular Dependence of the Ion-Induced Secondary Electron Emission for He+ and Ga+ Beams

Castaldo, Vincenzo, Withagen, Josephus, Hagen, Cornelius, Kruit, Pieter, van Veldhoven, Emile
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Volume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927611000225
Date:
July, 2011
File:
PDF, 1.07 MB
english, 2011
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