Study of the secondary ion emission by electrons from...

Journal of Physics Conference Series 2008 / 03 Vol. 100; Iss. 4

Study of the secondary ion emission by electrons from microchannel plates (MCP)

Nevshupa, R, Roman, E, Segovia, J L de, Konovalov, P, Baliasniy, L
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Volume:
100
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/100/4/042012
Date:
March, 2008
File:
PDF, 1.47 MB
english, 2008
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