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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Specification Test Compaction for Analog Circuits and MEMS
Biswas, S., Peng Li,, Blanton, R.D.S., Pileggi, L.T.Year:
2005
Language:
english
DOI:
10.1109/date.2005.277
File:
PDF, 373 KB
english, 2005