![](/img/cover-not-exists.png)
[IEEE 2011 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Osaka, Japan (2011.09.8-2011.09.10)] 2011 International Conference on Simulation of Semiconductor Processes and Devices - TCAD simulations of irradiated power diodes over a wide temperature range
Bellini, Marco, Vobecky, JanYear:
2011
Language:
english
DOI:
10.1109/sispad.2011.6035081
File:
PDF, 257 KB
english, 2011