[IEEE IEEE SOS/SOI Technology Conference - Stateline, NV,...

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[IEEE IEEE SOS/SOI Technology Conference - Stateline, NV, USA (3-5 Oct. 1989)] IEEE SOS/SOI Technology Conference - Materials and processing parameters affecting the radiation tolerance of SIMOX devices

Ipri, A.C., Jastrzebski, L.L., Peters, D., Policastro, S.
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Year:
1989
Language:
english
DOI:
10.1109/soi.1989.69810
File:
PDF, 134 KB
english, 1989
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