![](/img/cover-not-exists.png)
[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Building the electrical model of the pulsed photoelectric laser stimulation of a PMOS transistor in 90nm technology
Sarafianos, Alexandre, Gagliano, Olivier, Lisart, Mathieu, Serradeil, Valerie, Dutertre, Jean-Max, Tria, AssiaYear:
2013
Language:
english
DOI:
10.1109/ipfa.2013.6599120
File:
PDF, 1.36 MB
english, 2013