![](/img/cover-not-exists.png)
[IEEE 2010 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Qingdao, China (2010.07.11-2010.07.14)] 2010 International Conference on Wavelet Analysis and Pattern Recognition - Random sampling LDA incorporating feature selection for face recognition
Yang, Ming, Wan, Jian-Wu, Ji, Gen-LinYear:
2010
Language:
english
DOI:
10.1109/icwapr.2010.5576317
File:
PDF, 121 KB
english, 2010