![](/img/cover-not-exists.png)
[IEEE 2008 66th Annual Device Research Conference (DRC) - Santa Barbara, CA, USA (2008.06.23-2008.06.25)] 2008 Device Research Conference - Use of Highly Reflective Ohmic Contact and Surface KrF Laser Roughening to Improve Light Output of Vertical GaN-Based Light-Emitting Diodes
Lee, Wei-Chi, Uang, Kai-Ming, Kuo, Der-Ming, Chou, Jui-Chiang, Chen, Tron-Min, Kuo, Hon-Yi, Wang, Shui-JinnYear:
2008
Language:
english
DOI:
10.1109/drc.2008.4800774
File:
PDF, 2.39 MB
english, 2008