[IEEE 2005 IEEE International Integrated Reliability Workshop - S. Lake Tahoe, CA, USA (17-20 Oct. 2005)] 2005 IEEE International Integrated Reliability Workshop - Predictive Simulation to Improve Reliability of a Snapback-based NMOS Clamp
Gaitonde, P.G., Gaul, S.J., Crandell, T.L., Earles, S.K., Gaitonde, P.G., Gaul, S.J., Crandell, T.L., Earles, S.K.Year:
2005
Language:
english
DOI:
10.1109/irws.2005.1609578
File:
PDF, 1.65 MB
english, 2005