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[IEEE 2001 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers - Hsinchu, Taiwan (18-20 April 2001)] 2001 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers (Cat. No.01TH8517) - Nanoscale CMOS at low temperature: design, reliability, and scaling trend
Bin Yu,, Haihong Wang,, Riccobene, C., Hyeon-Seag Kim,, Qi Xiang,, Ming-Ren Lin,, Leland Chang,, Chenming Hu,Year:
2001
Language:
english
DOI:
10.1109/vtsa.2001.934473
File:
PDF, 272 KB
english, 2001