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[IEEE 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Nara, Japan (2013.12.15-2013.12.18)] 2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission
Boyer, A., Ben Dhia, S.Year:
2013
Language:
english
DOI:
10.1109/emccompo.2013.6735199
File:
PDF, 884 KB
english, 2013