[IEEE 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Waikoloa, HI, USA (2014.6.15-2014.6.19)] 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Investigation of anomalous relation for HCI-induced abrupt VT fall-off and gate-oxide destruction with Ig-Vg curves in LD-PMOSFETs

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