Within-Die Gate Delay Variability Measurement Using...

IEEE Transactions on Semiconductor Manufacturing 2009 / 05 Vol. 22; Iss. 2

Within-Die Gate Delay Variability Measurement Using Reconfigurable Ring Oscillator

Das, Bishnu Prasad, Amrutur, Bharadwaj, Jamadagni, H. S., Arvind, N. V., Visvanathan, V.
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Volume:
22
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/tsm.2009.2017662
Date:
May, 2009
File:
PDF, 1.31 MB
english, 2009
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