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[IEEE 2004 International Conference on Intelligent Mechatronics and Automation, 2004. - Chengdu, China (Aug. 26-31, 2004)] 2004 International Conference on Intelligent Mechatronics and Automation, 2004. Proceedings. - Motion stage design with scanning-by-probe AFM for imaging nanocrystals on sapphire surface
Yi-Cheng Huang,, Mou-Sheng Lin,, Che-Ming Liu,, Jyh-Chen Chen,Year:
2004
Language:
english
DOI:
10.1109/icima.2004.1384306
File:
PDF, 479 KB
english, 2004