[IEEE amp; Management Symposium (SEMI-THERM) - Santa Clara, CA (2010.02.21-2010.02.25)] 2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Experimental validation of the power blurring method
Je-Hyoung Park,, Sangho Shin,, Christofferson, James, Shakouri, Ali, Sung-Mo Kang,Year:
2010
Language:
english
DOI:
10.1109/stherm.2010.5444285
File:
PDF, 729 KB
english, 2010