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[IEEE 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 ECCE-ASIA) - Hiroshima, Japan (2014.5.18-2014.5.21)] 2014 International Power Electronics Conference (IPEC-Hiroshima 2014 - ECCE ASIA) - ESD reliability influence of a 60 V power LDMOS by the FOD-based (& Dotted-OD) drain
Chen, Shen-Li, Lee, Min-HuaYear:
2014
Language:
english
DOI:
10.1109/IPEC.2014.6869586
File:
PDF, 1.33 MB
english, 2014