[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Combining High Resolution Pulsed TIVA and nanoprobing techniques to identify drive strength issues in mixed signal circuits
Ravikumar, VK, Ho, MY, Goruganthu, RR, Phoa, SL, Narang, V, Chin, JMYear:
2010
Language:
english
DOI:
10.1109/ipfa.2010.5531991
File:
PDF, 269 KB
english, 2010