[IEEE 1991 41st Electronic Components & Technology Conference - Atlanta, GA, USA (11-16 May 1991)] 1991 Proceedings 41st Electronic Components & Technology Conference - A reliability study of laser trimmed NiCr kerfs
Linn, J.H., LaFontaine, D.B., Belcher, R.W., Shlepr, M.G., Wade, W.R.Year:
1991
Language:
english
DOI:
10.1109/ectc.1991.163983
File:
PDF, 656 KB
english, 1991