[IEEE 2014 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Belgium (2014.04.7-2014.04.9)] 2014 15th International Conference on Thermal, Mechanical and Mulit-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Electrical characteristics evolution of the Deep Trench Termination diode based on a finite elements simulation approach
Baccar, F., Le Henaff, F., Theolier, L., Azzopardi, S., Woirgard, E.Year:
2014
Language:
english
DOI:
10.1109/eurosime.2014.6813814
File:
PDF, 1.80 MB
english, 2014