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[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Prediction of channel thermal noise in twin silicon nanowire MOSFET (TSNWFET)
Jaehong Lee,, Jongwook Jeon,, Junsoo Kim,, Byung-Gook Park,, Jong Duk Lee,, Hyungcheol Shin,Year:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734463
File:
PDF, 1.91 MB
english, 2008