[IEEE 2008 9th International Conference on Solid-State and...

  • Main
  • [IEEE 2008 9th International Conference...

[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Prediction of channel thermal noise in twin silicon nanowire MOSFET (TSNWFET)

Jaehong Lee,, Jongwook Jeon,, Junsoo Kim,, Byung-Gook Park,, Jong Duk Lee,, Hyungcheol Shin,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734463
File:
PDF, 1.91 MB
english, 2008
Conversion to is in progress
Conversion to is failed