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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Comparison of applications of laser probing, laser-induced circuit perturbation and photon emission for failure analysis and yield enhancement
Kasapi, Steven, Ng, Roy, Liao, Joy, Lo, William, Cory, Bruce, Marks, HowardYear:
2012
Language:
english
DOI:
10.1109/irps.2012.6241782
File:
PDF, 702 KB
english, 2012