![](/img/cover-not-exists.png)
[IEEE 1998 IEEE International Workshop on IDDQ Testing - San Jose, CA, USA (November 12-13, 1998)] Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No.98EX232) - Clustering based identification of faulty ICs using I/sub DDQ/ tests
Jandhyala, S., Balachandran, H., Menon, S., Jayasumana, A.Year:
1998
Language:
english
DOI:
10.1109/iddq.1998.730756
File:
PDF, 43 KB
english, 1998