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[IEEE 2009 Annual Reliability and Maintainability Symposium (RAMS) - Fort Worth, TX, USA (2009.01.26-2009.01.29)] 2009 Annual Reliability and Maintainability Symposium - Optimal design for step-stress accelerated degradation testing with competing failure modes
Xiaoyang Li,, Tongmin Jiang,Year:
2009
Language:
english
DOI:
10.1109/rams.2009.4914651
File:
PDF, 428 KB
english, 2009