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[IEEE 2008 IEEE MTT-S International Microwave Symposium...

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[IEEE 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008 - Atlanta, GA, USA (2008.06.15-2008.06.20)] 2008 IEEE MTT-S International Microwave Symposium Digest - A fast scanning laser probe based on Sagnac interferometer for RF surface and bulk acoustic wave devices

Ken-ya Hashimoto,, Keisuke Kashiwa,, Tatsuya Omori,, Masatsune Yamaguchi,, Osamu Takano,, Sakae Meguro,, Koichi Akahane,
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Year:
2008
Language:
english
DOI:
10.1109/mwsym.2008.4632966
File:
PDF, 9.07 MB
english, 2008
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